Curic measure++ for SketchUp for MacOS Download (Latest 2025) - FileCR
Free download Curic measure++ for SketchUp for MacOS Latest full version - The Overlay API to display measurements as you hover.
Free download Curic measure++ for SketchUp for MacOS Latest full version - The Overlay API to display measurements as you hover.
Free Download Curic measure++ for SketchUp full version standalone offline installer for MacOS. It's not a new tool - just an add-on that shows more information when you use the native Tape Measure in SketchUp.
It is an add-on extension for SketchUp that enhances your interaction with the Tape Measure tool. When you measure distances in SketchUp, the tool typically shows the raw distance, but it goes a step further by providing more information about your measurements. This includes the ability to view angular information, align with axes, and more, which can be incredibly helpful when designing in 3D.
The main advantage of this extension is its ability to enhance precision. Designers and architects often need to know more than just a straight-line distance. With this tool, you can see not just the distance, but also other contextual measurements such as angle, depth, and alignment. This can be particularly useful when working with complex 3D models where every detail counts. The extension works seamlessly with SketchUp's native Tape Measure, ensuring that you won't need to learn new tools or workflows to start using the additional features.
An invaluable tool for anyone looking to get more precise measurements and save time during the design process. It enhances the native Tape Measure tool in SketchUp, making it more efficient and user-friendly, especially for users working with complex 3D models. The plugin is easy to install, highly customizable, and free to use, making it accessible to a wide range of users. Whether you're a professional architect or a hobbyist, it can significantly improve the accuracy and efficiency of your SketchUp work.
Leave a comment
Your email address will not be published. Required fields are marked *